AFM image visualization of layered dichalcogenides, 1T-MTe(2) (M=V, Ta)

被引：11

作者：

Kim, SJ

Park, SJ

Jeon, IC

Kim, C

Pyun, C

Yee, KA

机构：

[1] KOREA INST SCI & TECHNOL, SEOUL 130650, SOUTH KOREA

[2] EWHA WOMANS UNIV, DEPT CHEM, SEOUL 120750, SOUTH KOREA

[3] JEONBUK NATL UNIV, DEPT CHEM, JEONBUK 560756, SOUTH KOREA

来源：

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1997年 / 58卷 / 04期

关键词：

ditelluride; AFM; electronic structure; CDW; clustering;

D O I：

10.1016/S0022-3697(96)00146-1

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The surface structures of the layered chalcogenide VTe2, TaTe2 were probed by atomic force microscopy (AFM). The observed AFM images at the atomic level were analyzed by calculating the total electron density maps. The title compounds adopt double zigzag CDWs (Charge Density Waves) resulting in three unique tellurides. Thus, the brightness of the AFM image on the corrugated surface decreases in the order of Te(3) > Te(1) much greater than Te(2). Also, metal in the VTe2 system is more localized than that of TaTe2. (C) 1997 Elsevier Science Ltd.

引用

页码：659 / 663

页数：5

共 15 条

[1] ATOMIC FORCE MICROSCOPE [J].