Plasma-assisted molecular beam epitaxy of AlGaN heterostructures for deep-ultraviolet optically pumped lasers

被引:51
作者
Jmerik, V. N. [1 ]
Lutsenko, E. V. [2 ]
Ivanov, S. V. [1 ]
机构
[1] RAS, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] NAS Belarus, Stepanov Inst Phys, Minsk 220072, BELARUS
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2013年 / 210卷 / 03期
关键词
AlGaN; deep UV lasers; dislocations; growth kinetics; plasma-assisted MBE; quantum wells; ATOMIC-LAYER EPITAXY; THREADING DISLOCATIONS; THERMODYNAMIC ANALYSIS; STRESS-RELAXATION; MISMATCHED LAYERS; GROWTH-KINETICS; TEMPERATURE; FILMS; ALN; EMISSION;
D O I
10.1002/pssa.201300006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The paper reports on elaboration of plasma-assisted molecular beam epitaxy (MBE) of AlxGa1xN-based quantum-well (QW) structures with high Al content (up to 50% in the QW) grown directly on c-sapphire. Different elements of the structure design are considered consecutively in detail along with the advanced growth approaches developed for each element. Special attention is paid to the growth conditions of (i) AlN nucleation layers with suppressed generation of threading dislocations (TDs), (ii) 2-mu m thick AlN buffer layers with atomically smooth droplet-free morphology (rms=0.46nm) grown under the strongly metal-rich conditions, (iii) cladding and waveguide AlGaN layers also possessing the atomically smooth droplet-free morphology that is ensured by the accurately established phase diagram of metal(Ga)-rich growth conditions within the temperature range 660780 degrees C. Employing several 3-nm thick strained GaN insertions in the AlN buffer layer and a AlGaN/AlN superlattice (SL) on top of it is shown to result in a significant decrease of TD's density down to 108109cm2 in the top QW region fabricated by a submonolayer digital alloying (SDA) technique. Finally, advanced AlGaN-based QW structures are presented, which demonstrate optically pumped lasing within the deep-ultraviolet (UV) wavelength range with the threshold power density below 600kWcm2 (at 289nm).
引用
收藏
页码:439 / 450
页数:12
相关论文
共 65 条
  • [1] ALCOCK CB, 1984, CAN METALL QUART, V23, P309
  • [2] Growth and characterization of Mg-doped AlGaN-AlN short-period superlattices for deep-UV optoelectronic devices
    Allerman, A. A.
    Crawford, M. H.
    Miller, M. A.
    Lee, S. R.
    [J]. JOURNAL OF CRYSTAL GROWTH, 2010, 312 (06) : 756 - 761
  • [3] Determination of the Al mole fraction and the band gap bowing of epitaxial AlxGa1-xN films
    Angerer, H
    Brunner, D
    Freudenberg, F
    Ambacher, O
    Stutzmann, M
    Hopler, R
    Metzger, T
    Born, E
    Dollinger, G
    Bergmaier, A
    Karsch, S
    Korner, HJ
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (11) : 1504 - 1506
  • [4] Reduction of threading dislocation densities in AlN/sapphire epilayers driven by growth mode modification
    Bai, J
    Dudley, M
    Sun, WH
    Wang, HM
    Khan, MA
    [J]. APPLIED PHYSICS LETTERS, 2006, 88 (05) : 1 - 3
  • [5] Investigation of AlN films grown by molecular beam epitaxy on vicinal Si(111) as templates for GaN quantum dots
    Benaissa, M.
    Vennegues, P.
    Tottereau, O.
    Nguyen, L.
    Semond, F.
    [J]. APPLIED PHYSICS LETTERS, 2006, 89 (23)
  • [6] Deep ultraviolet emitting AlGaN quantum wells with high internal quantum efficiency
    Bhattacharyya, A.
    Moustakas, T. D.
    Zhou, Lin
    Smith, David. J.
    Hug, W.
    [J]. APPLIED PHYSICS LETTERS, 2009, 94 (18)
  • [7] Si-doped AlxGa1-xN(0.56≤ x ≤1) layers grown by molecular beam epitaxy with ammonia -: art. no. 132106
    Borisov, B
    Kuryatkov, V
    Kudryavtsev, Y
    Asomoza, R
    Nikishin, S
    Song, DY
    Holtz, M
    Temkin, H
    [J]. APPLIED PHYSICS LETTERS, 2005, 87 (13) : 1 - 3
  • [8] Role of inclined threading dislocations in stress relaxation in mismatched layers
    Cantu, P
    Wu, F
    Waltereit, P
    Keller, S
    Romanov, AE
    DenBaars, SP
    Speck, JS
    [J]. JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)
  • [9] Origin of defect-insensitive emission probability in In-containing (Al, In, Ga) N alloy semiconductors
    Chichibu, Shigefusa F.
    Uedono, Akira
    Onuma, Takeyoshi
    Haskell, Benjamin A.
    Chakraborty, Arpan
    Koyama, Takahiro
    Fini, Paul T.
    Keller, Stacia
    Denbaars, Steven P.
    Speck, James S.
    Mishra, Umesh K.
    Nakamura, Shuji
    Yamaguchi, Shigeo
    Kamiyama, Satoshi
    Amano, Hiroshi
    Akasaki, Isamu
    Han, Jung
    Sota, Takayuki
    [J]. NATURE MATERIALS, 2006, 5 (10) : 810 - 816
  • [10] Enhanced room-temperature luminescence efficiency through carrier localization in AlxGa1-xN alloys -: art. no. 031916
    Collins, CJ
    Sampath, AV
    Garrett, GA
    Sarney, WL
    Shen, H
    Wraback, M
    Nikiforov, AY
    Cargill, GS
    Dierolf, V
    [J]. APPLIED PHYSICS LETTERS, 2005, 86 (03) : 1 - 3