Secondary light charged particle emission from the interaction of 25-to 65-MeV neutrons on silicon

被引:26
作者
Benck, S
Slypen, I
Meulders, JP
Corcalciuc, V
机构
[1] Catholic Univ Louvain, Inst Phys Nucl, B-1348 Louvain, Belgium
[2] Inst Atom Phys, Bucharest, Romania
关键词
D O I
10.13182/NSE02-A2266
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Double-differential cross sections for the production of protons, deuterons, tritons, and alpha particles from a silicon target were determined using fast incident neutrons. The inclusive charged particle emission spectra were measured at six laboratory angles, 20, 40, 60, 70, 110, and 140 deg, over the neutron energy range of 25 to 65 MeV. Representative results are shown for the cross-section differentials in energy and angle as well as for angle-integrated cross sections. The spectra are compared to existing data and with predictions from nuclear model calculations. Since the data for 62.7-MeV incident neutrons are the most complete, we emphasized these results; from the experimental energy-differential cross sections, the total charged particle production cross sections are determined as well as the partial and total kerma coefficients for silicon. Moreover, a comparison is done Both our data on aluminum, for which exists a consistent set of measured cross sections in the same neutron energy region.
引用
收藏
页码:55 / 65
页数:11
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