An application of wavelet transform to speckle correlation measurement

被引：0

作者：

Wei, Z ^{[1
]}

Yang, L

Wen, LC

Wu, HI

Liang, LZ

机构：

[1] Res Inst Hightech Hongqing Town, Dept Phys, Xian 710025, Peoples R China

[2] Res Inst Hightech Hongqing Town, Dept 803, Xian 710025, Peoples R China

来源：

2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PTS 1 AND 2 | 2006年 / 6150卷

关键词：

Wavelet Transform; Fourier Transform; Mexican-hat; Haar wavelet; speckle; edge extraction; matched filtering; correlation; non-stationary process; image;

D O I：

10.1117/12.676864

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

When applying speckle correlation measurement to the study on the displacement and deformation of objects, a very strict position accuracy of the correlated peak is required, but the correlated peak acquired from speckle frequency-domain correlation is not sharp enough, thus affecting the measurement accuracy directly. In the paper, a wavelet preprocess method for the speckle image is presented. By this means, the speckle edge character is firstly extracted, and the correlation calculation is then performed, and the correlated peak is sharpened. The computer simulated result indicates that the correlated peak can be sharpened and enhanced; and the signal-to-noise ratio is also heightened.

引用

页数：5

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