GaN-based p-i-n sensors with ITO contacts

被引:28
作者
Chang, SJ [1 ]
Ko, TK
Su, YK
Chiou, YZ
Chang, CS
Shei, SC
Sheu, JK
Lai, WC
Lin, YC
Chen, WS
Shen, CF
机构
[1] Natl Cheng Kung Univ, Inst Microelect, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
[3] So Taiwan Univ Technol, Dept Elect Engn, Tainan 70101, Taiwan
[4] Epitech Technol Corp, Hsinshi 744, Taiwan
[5] Natl Cheng Kung Univ, Dept Electroopt Sci & Engn, Tainan 70101, Taiwan
关键词
GaN; indium-tin-oxide (ITO); p-i-n; photodetectors; strain layer superlattice (SLS);
D O I
10.1109/JSEN.2006.870151
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nitride-based p-i-n sensors with indium-tin-oxide electrodes on Mg-doped AlGaN/GaN strain layer superlattice structure were fabricated and characterized. It was found that the fabricated sensors exhibit small dark current and large reverse breakdown voltage. With an incident wavelength of 355 run, we achieved a peak responsivity of 0.17 A/W which corresponds to 59% external quantum efficiency for sensors with 500 degrees C annealed ITO(70 nm) p-contacts.
引用
收藏
页码:406 / 411
页数:6
相关论文
共 22 条
  • [1] Chanard J, 2003, NEPHROLOGIE, V24, P3
  • [2] High brightness InGaN green LEDs with an ITO on n++-SPS upper contact
    Chang, CS
    Chang, SJ
    Su, YK
    Kuo, CH
    Lai, WC
    Lin, YC
    Hsu, YP
    Shei, SC
    Tsai, JM
    Lo, HM
    Ke, JC
    Shen, JK
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (11) : 2208 - 2212
  • [3] Nitride-based LEDs with 800 °C grown p-AllnGaN-GaN double-cap layers
    Chang, SJ
    Wu, LW
    Su, YK
    Hsu, YP
    Lai, WC
    Tsai, JA
    Sheu, JK
    Lee, CT
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2004, 16 (06) : 1447 - 1449
  • [4] Highly reliable nitride-based LEDs with SPS plus ITO upper contacts
    Chang, SJ
    Chang, CS
    Su, YK
    Chuang, RW
    Lin, YC
    Shei, SC
    Lo, HM
    Lin, HY
    Ke, JC
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2003, 39 (11) : 1439 - 1443
  • [5] GaN metal-semiconductor-metal photodetectors with low-temperature-GaN cap layers and ITO metal contacts
    Chang, SJ
    Lee, ML
    Sheu, JK
    Lai, WC
    Su, YK
    Chang, CS
    Kao, CJ
    Chi, GC
    Tsai, JA
    [J]. IEEE ELECTRON DEVICE LETTERS, 2003, 24 (04) : 212 - 214
  • [6] InGaN-GaN multiquantum-well blue and green light-emitting diodes
    Chang, SJ
    Lai, WC
    Su, YK
    Chen, JF
    Liu, CH
    Liaw, UH
    [J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (02) : 278 - 283
  • [7] 400-nm InGaN-GaN and InGaN-AlGaN multiquantum well light-emitting diodes
    Chang, SJ
    Kuo, CH
    Su, YK
    Wu, LW
    Sheu, JK
    Wen, TC
    Lai, WC
    Chen, JF
    Tsai, JM
    [J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (04) : 744 - 748
  • [8] Schottky barrier detectors on GaN for visible-blind ultraviolet detection
    Chen, Q
    Yang, JW
    Osinsky, A
    Gangopadhyay, S
    Lim, B
    Anwar, MZ
    Khan, MA
    Kuksenkov, D
    Temkin, H
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (17) : 2277 - 2279
  • [9] Nitride-based p-i-n bandpass photodetectors
    Chiou, YZ
    [J]. IEEE ELECTRON DEVICE LETTERS, 2005, 26 (03) : 172 - 174
  • [10] High detectivity InGaN-GaN multiquantum well p-n junction photodiodes
    Chiou, YZ
    Su, YK
    Chang, SJ
    Gong, J
    Lin, YC
    Liu, SH
    Chang, CS
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2003, 39 (05) : 681 - 685