Studying the Composition and Phase State of Thin PZT Films Obtained by High-Frequency Magnetron Sputtering under Variation of Working Gas Pressure

被引:8
作者
Dolgintsev, D. M. [1 ]
Pronin, V. P. [1 ]
Kaptelov, E. Yu. [1 ,2 ]
Senkevich, S. V. [1 ,2 ]
Pronin, I. P. [1 ,2 ]
机构
[1] Herzen State Pedag Univ Russia, St Petersburg 191186, Russia
[2] Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
基金
俄罗斯基础研究基金会;
关键词
LEAD-ZIRCONATE-TITANATE; POLARIZATION;
D O I
10.1134/S1063785019030258
中图分类号
O59 [应用物理学];
学科分类号
摘要
Variation of the working gas pressure (from 8 to 2 Pa) during RF magnetron sputtering deposition of thin perovskite lead zirconate titanate (PZT) films revealed strong changes in their lead content, which decreased below the stoichiometric level and led to the formation of a two-phase (perovskite-pyrochlore) structure upon subsequent high-temperature annealing. Measurements of the composition of perovskite islands in the two-phase films showed that the lead content in these islands was equal to or greater than stoichiometric. These results lead to the conclusion that the obtained PZT films are free of lead vacancies.
引用
收藏
页码:246 / 249
页数:4
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