A service interruption free testing methodology for IEDs in IEC 61850-based substation automation systems

被引:6
|
作者
Lim, Seongil [1 ]
机构
[1] Kyungnam Univ, Dept Elect Engn, Chang Won, South Korea
关键词
IEC; 61850; Intelligent electronic devices (IEDs) testing; Substation configuration language; (SCL)-based engineering; Service interruption; Service reliability; Substation automation systems (SAS);
D O I
10.1016/j.ijepes.2016.11.007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a methodology for the testing of intelligent electronic devices (IEDs) in IEC 61850 based substation automation systems (SAS), without any service interruption to the end users, during the testing process. IEC 61850-based SAS provides opportunities for a new level of substation operation, enhancing operating efficiency, and protection reliability based on Ethernet-based communication networks. Due to these changes to the conventional substations, importance and dependency on IEDs is increasing rapidly. Frequency of faults occurring in the power systems is random in nature and is unpredictable. It is necessary to test and maintain the IEDs to ensure their proper operation at crucial times. This paper presents a novel methodology for testing the IEDs, without compromising the service reliability during the testing process. The proposed methodology exploits the inherit characteristics of IEC 61850 standard i.e. Network - based communication, interchangeability between multivendor IEDs, and engineering based on substation configuration language (SCL) files. The feasibility and robustness of the proposed method has been verified by performing several performance verification tests with different performance metrics. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:65 / 76
页数:12
相关论文
共 50 条
  • [41] Implementation and Test of an IEC 61850-Based Automation Framework for the Automated Data Model Integration of DES (ADMID) into DSO SCADA
    Chen, Shuo
    Ebe, Falko
    Morris, Jeromie
    Lorenz, Heiko
    Kondzialka, Christoph
    Heilscher, Gerd
    ENERGIES, 2022, 15 (04)
  • [42] A High-Level Framework for Implementation and Test of IEC 61850-based Microgrid Power Management Systems
    Gray, Keith
    Kumm, John
    Mraz, Jared
    2016 IEEE/PES TRANSMISSION AND DISTRIBUTION CONFERENCE AND EXPOSITION (T&D), 2016,
  • [43] IEC 61850-Based Protection Scheme for Multiple Feeder Faults and Hardware-in-the-Loop Platform for Interoperability Testing
    Penthong, Thanakorn
    Ginocchi, Mirko
    Ahmadifar, Amir
    Ponci, Ferdinanda
    Monti, Antonello
    IEEE ACCESS, 2023, 11 : 65181 - 65196
  • [44] IEC 61850-Based Centralized Protection against Single Line-To-Ground Faults in Ungrounded Distribution Systems
    Nam, Soon-Ryul
    Ko, Woong-Hie
    Key, Sopheap
    Kang, Sang-Hee
    Lee, Nam-Ho
    ENERGIES, 2021, 14 (03)
  • [45] New concept and procedure for reliability assessment of an IEC 61850 based substation and distribution automation considering secondary device faults
    Hayati, Hosein
    Ahadi, Amir
    Miryousefi Aval, Seyed Mohsen
    FRONTIERS IN ENERGY, 2015, 9 (04) : 387 - 398
  • [46] Method to Prevent the Malfunction Caused by the Transformer Magnetizing Inrush Current using IEC 61850-based IEDs and Dynamic Performance Test using RTDS Test-bed
    Kang, Hae-Gweon
    Song, Un-Sig
    Kim, Jin-Ho
    Kim, Se-Chang
    Park, Jong-Soo
    Park, Jong-Eun
    JOURNAL OF ELECTRICAL ENGINEERING & TECHNOLOGY, 2014, 9 (03) : 1104 - 1111
  • [47] IEC61850-Based Systems-Functional Testing and Interoperability Issues
    Manassero, Giovanni, Jr.
    Pellini, Eduardo Lorenzetti
    Senger, Eduardo Cesar
    Nakagomi, Renato Mikio
    IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2013, 9 (03) : 1436 - 1444
  • [48] Performance analysis of IEC 61850-9-2 process-bus based redundant substation automation system architecture
    Gupta, Sunil
    Gandhar, Abhishek
    Gandhar, Shashi
    JOURNAL OF INFORMATION & OPTIMIZATION SCIENCES, 2020, 41 (01): : 13 - 23
  • [49] Reliability analysis of a novel IEC 61850-9-2 process-bus based substation automation system architecture
    Gupta, Sunil
    Gandhar, Abhishek
    Tiwari, Mohit
    JOURNAL OF STATISTICS & MANAGEMENT SYSTEMS, 2020, 23 (01): : 65 - 75
  • [50] Impact of Quality of Repairs and Common Cause Failures on the Reliability Performance of Intra-Bay IEC 61850 Substation Communication Network Architecture Based on Markov and Linear Dynamical Systems
    Mathebula, Vonani Clive
    Saha, Akshay Kumar
    IEEE ACCESS, 2021, 9 : 112805 - 112820