A service interruption free testing methodology for IEDs in IEC 61850-based substation automation systems

被引:6
|
作者
Lim, Seongil [1 ]
机构
[1] Kyungnam Univ, Dept Elect Engn, Chang Won, South Korea
关键词
IEC; 61850; Intelligent electronic devices (IEDs) testing; Substation configuration language; (SCL)-based engineering; Service interruption; Service reliability; Substation automation systems (SAS);
D O I
10.1016/j.ijepes.2016.11.007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a methodology for the testing of intelligent electronic devices (IEDs) in IEC 61850 based substation automation systems (SAS), without any service interruption to the end users, during the testing process. IEC 61850-based SAS provides opportunities for a new level of substation operation, enhancing operating efficiency, and protection reliability based on Ethernet-based communication networks. Due to these changes to the conventional substations, importance and dependency on IEDs is increasing rapidly. Frequency of faults occurring in the power systems is random in nature and is unpredictable. It is necessary to test and maintain the IEDs to ensure their proper operation at crucial times. This paper presents a novel methodology for testing the IEDs, without compromising the service reliability during the testing process. The proposed methodology exploits the inherit characteristics of IEC 61850 standard i.e. Network - based communication, interchangeability between multivendor IEDs, and engineering based on substation configuration language (SCL) files. The feasibility and robustness of the proposed method has been verified by performing several performance verification tests with different performance metrics. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:65 / 76
页数:12
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