Statistical Fault Injection

被引：44

作者：

Ramachandran, Pradeep ^{[1
]}

Kudva, Prabhakar ^{[2
]}

Kellington, Jeffrey ^{[1
]}

Schumann, John ^{[1
]}

Sanda, Pia ^{[1
]}

机构：

[1] IBM Syst & Technol Grp, Poughkeepsie, NY 12601 USA

[2] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY USA

来源：

2008 IEEE INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS & NETWORKS WITH FTCS & DCC | 2008年

关键词：

Fault Injection; Soft Errors; SER; SFI;

D O I：

10.1109/DSN.2008.4630080

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A method for Statistical Fault Injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a modern microprocessor. As performed on the IBM POWER6 microprocessor, SF1 is capable of distinguishing between error handling states associated with the injected bit flip. Methodologies to perform random and targeted fault injection are presented.

引用

页码：122 / +

页数：2

共 18 条

[1]

[Anonymous], P INT C DEP SYST NET

[2]

[Anonymous], 2004, P INT C DEP SYST NET

[3]

BISWAS A, 2005, P INT S COMP ARCH IS

[4]

CAKICI S, 2006, WORKSH SIL EFF LOG S

[5]

CONSTANTINESCU C, 2005, P INT C DEP SYST NET

[6]

KANAWATI G, 1995, IEEE T COMPUTER, V44

[7]

Kellington J., 2007, WORKSH SIL EFF LOG S

[8]

Kudva P., 2007, WORKSH ARCH SUPP GIG

[9] Functional verification of the POWER4 microprocessor and POWER4 multiprocessor systems [J].

Ludden, JM ;

Roesner, W ;

Heiling, GM ;

Reysa, JR ;

Jackson, JR ;

Chu, BL ;

Behm, ML ;

Baumgartner, JR ;

Peterson, RD ;

Abdulhafiz, J ;

Bucy, WE ;

Klaus, JH ;

Klema, DJ ;

Le, TN ;

Lewis, FD ;

Milling, PE ;

McConville, LA ;

Nelson, BS ;

Paruthi, V ;

Pouarz, TW ;

Romonosky, AD ;

Stuecheli, J ;

Thompson, KD ;

Victor, DW ;

Wile, B .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2002, 46 (01) :53-76

[10]

MACK M, 2007, IBM J RES DEV, V51

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