Simulation of surface structural relaxation kinetics in silica glass accelerated by water vapor

被引:5
作者
Koike, A. [1 ]
Tomozawa, M. [1 ]
机构
[1] Rensselaer Polytech Inst, Dept Mat Sci & Engn, Troy, NY 12180 USA
关键词
Optical spectroscopy; FTIR measurements; Silica; Surfaces and interfaces; Glass transition; Structural relaxation; Water;
D O I
10.1016/j.jnoncrysol.2008.07.024
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
It is known that surface structural relaxation of silica glass takes place more rapidly than bulk structural relaxation, especially in the presence of water vapor. The effect of water vapor pressure, heat-treatment temperature and initial fictive temperature on the Surface structural relaxation kinetics in silica glasses was investigated by measuring the change of the Surface fictive temperature determined from the IR reflection peak shift of silica structural bands. The superimposed component of bulk structural relaxation Was Subtracted from the measured surface structural relaxation data to isolate the true surface structural relaxation kinetics. The obtained surface structural relaxation data as a function of fictive temperature, heating temperature and water vapor pressure were simulated with a model based on the diffusion equation with time-dependent surface concentration. The simulation model was used to predict the surface structural relaxation kinetics of the optical fiber having a high fictive temperature of similar to. 1650 degrees C at 950 degrees C under 355 torr of water vapor, and it was confirmed that the present model can Simulate surface structural relaxation of the fiber reasonably well. (C) 2008 Elsevier B.V. All rights reserved.
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页码:4981 / 4990
页数:10
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