Direct observation of the Si(110)-(16x2) surface reconstruction by atomic force microscopy

被引：1

作者：

Yamamoto, Tatsuya ^{[1
]}

Izumi, Ryo ^{[1
]}

Miki, Kazushi ^{[2
]}

Yamasaki, Takahiro ^{[3
]}

Sugawara, Yasuhiro ^{[1
]}

Li, Yan Jun ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn, Dept Appl Phys, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan

[2] Univ Hyogo, Dept Elect Mat & Engn, Shoya 2167, Himeji, Hyogo 6712280, Japan

[3] Osaka Univ, Inst Nanosci Design, 1-2 Machikaneyama, Toyonaka, Osaka 5600043, Japan

来源：

BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 2020年 / 11卷

基金：

日本学术振兴会;

关键词：

atomic force microscopy (AFM); noncontact atomic force microscopy (NC-AFM); Si(110); Si(110)-(16x2); SI(110)-16X2; MOBILITY; SILICON;

D O I：

10.3762/bjnano.11.157

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The atomic arrangement of the Si(110)-(16x2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K. The pentagonal structure, which is the most important building block of the reconstruction, was concluded to consist of five atoms, while only four or five spots (depending on tip bias) have been reported with scanning tunneling microscopy (STM). Single atoms were determined to exist near step edges between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16x2) reconstruction, which indeed has a complex structure.

引用

页码：1750 / 1756

页数：7

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