Interfacial glass transition profiles in ultrathin, spin cast polymer films

被引:62
|
作者
Sills, S
Overney, RM [1 ]
Chau, W
Lee, VY
Miller, RD
Frommer, J
机构
[1] Univ Washington, Dept Chem Engn, Seattle, WA 98195 USA
[2] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
来源
JOURNAL OF CHEMICAL PHYSICS | 2004年 / 120卷 / 11期
关键词
D O I
10.1063/1.1647047
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Interfacial glass transition temperature (T-g) profiles in spin cast, ultrathin films of polystyrene and derivatives were investigated using shear-modulated scanning force microscopy. The transitions were measured as a function of film thickness (delta), molecular weight, and crosslinking density. The T-g(delta) profiles were nonmonotonic and exhibited two regimes: (a) a sublayer extending about 10 nm from the substrate, with T-g values lowered up to similar to 10 degreesC below the bulk value, and (b) an intermediate regime extending over 200 nm beyond the sublayer, with T-g values exceeding the bulk value by up to 10 degreesC. Increasing the molecular weight was found to shift the Tg(delta) profiles further from the substrate interface, on the order of 10 nm/kDa. Crosslinking the precast films elevated the absolute T-g values, but had no effect on the spatial length scale of the T-g(delta) profiles. These results are explained in the context of film preparation history and its influence on molecular mobility. Specifically, the observed theological anisotropy is interpreted based on the combined effects of shear-induced structuring and thermally activated interdiffusion. (C) 2004 American Institute of Physics.
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收藏
页码:5334 / 5338
页数:5
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