High-Speed FPGA Configuration and Testing Through JTAG

被引:0
作者
Gruwell, Ammon [1 ]
Zabriskie, Peter [1 ]
Wirthlin, Michael [1 ]
机构
[1] Brigham Young Univ, Dept Elect & Comp Engn, NSF Ctr High Performance Reconfigurable Comp CHRE, Provo, UT 84602 USA
来源
2016 IEEE AUTOTESTCON PROCEEDINGS | 2016年
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Since most FPGAs use the universal JTAG port to support configuration memory access, hardware and software tools are needed to maximize the speed of FPGA configuration management over JTAG. This paper introduces a tool called the JTAG Configuration Manager (JCM) that enables high-speed programmable access to the configuration memory of FPGAs through JTAG. This tool consists of a linux-based software library running on an embedded ARM processor paired with a hardware JTAG controller module implemented in programmable logic. This JTAG controller optimizes the speed and timing of JTAG transactions over cables of any length using an automatic speed calibration process. This JTAG interface enables custom configuration sequences to be sent at high speeds. The JCM also has access to all JTAG interfaces of the FPGA including temperature monitoring and internal Boundary SCAN, making it useful for many testing and verification applications.
引用
收藏
页数:8
相关论文
共 19 条
[1]  
[Anonymous], 2015, 2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS)
[2]  
[Anonymous], 2016, ZYNQ 7000 ALL PROGR
[3]   A Fault Analysis and Classifier Framework for Reliability-aware SRAM-based FPGA Systems [J].
Bolchini, Cristiana ;
Castro, Fabrizio ;
Miele, Antonio .
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE VLSI SYSTEMS, PROCEEDINGS, 2009, :173-181
[4]  
Digilent, 2015, JTAG HS2 PROGR CABL
[5]  
Digilent, 2005, DIG PORT COMM PROGR
[6]  
EMBECOSM, 2009, JTAG CHIP ARCH
[7]  
Faust R., 2006, uS Patent, Patent No. [7,076,708, 7076708]
[8]  
Hassan A, 2015, IEEE I C ELECT CIRC, P183, DOI 10.1109/ICECS.2015.7440279
[9]  
Lu M, 2013, IEEE INT WORKS GENET, P1, DOI DOI 10.1155/2013/146860
[10]  
Marchetti TE, 2010, IEEE AUTOTESTCON, P58