Competition for adsorption sites between atomic Be and Si on W(100)

被引:2
作者
Rut'kov, E. V. [1 ]
Afanas'eva, E. Y. [1 ]
Gall, N. R. [1 ]
机构
[1] Ioffe Inst, Politech Skaya 26, St Petersburg 194021, Russia
关键词
Beryllium; Silicon; Surface compounds; Tungsten; Coadsorption; TUNGSTEN; SILICON; SURFACE; BERYLLIUM; SULFUR; COADSORPTION; CARBON;
D O I
10.1016/j.susc.2022.122161
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
It has been shown that Be deposition onto W(100) at 1100-1200 K results in displacement of earlier deposited Si atoms from the surface into the bulk, and the displacement is performed in "atom-to atom" mode, so that the total concentration of both adsorbates stays constant. Dissolution of Be atoms into the substrate at 1400 K leads to Si coming out from the bulk to surface. We attribute this to the fact that Be is adsorbed similarly to p-block atoms that form surface compounds on the (100) face of bcc metals.
引用
收藏
页数:5
相关论文
共 28 条
[1]  
Ageev V.N., 1987, POVERHNOST, V5, P7
[2]  
AGEEV VN, 1986, PISMA ZH TEKH FIZ+, V12, P565
[3]   Quantum modeling (DFT) and experimental investigation of beryllium-tungsten alloy formation [J].
Allouche, A. ;
Wiltner, A. ;
Linsmeier, Ch .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2009, 21 (35)
[4]  
Cahn J., 1979, Interfacial Segregation, P3
[5]   THE GROWTH OF POLYCRYSTALLINE SILICON ON MOLYBDENUM, TANTALUM, TUNGSTEN, AND THEIR DISILICIDES [J].
CAMPISI, GJ ;
BEVOLO, AJ ;
SHANKS, HR ;
SCHMIDT, FA .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1714-1719
[6]   DIRECT OBSERVATION OF ATOMIC PROCESSES - SILICON ADATOMS ON TUNGSTEN SURFACES [J].
CASANOVA, R ;
TSONG, TT .
THIN SOLID FILMS, 1982, 93 (1-2) :41-66
[7]   Beryllium, tungsten and their alloys Be2W and Be12W: Surface defect energetics from density functional theory calculations [J].
Chen, L. ;
Sukuba, I. ;
Probst, M. ;
Kaiser, A. .
NUCLEAR MATERIALS AND ENERGY, 2018, 16 :149-157
[8]  
Davis L. E., 1978, Handbook of Auger Electron Spectroscopy, V2nd
[9]  
Defay R., 1966, Surface Tension and Adsorption
[10]  
Fomenko VS., 1981, Emission Properties of Materials