Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial

被引：30

作者：

Dardano, Principia ^{[1
]}

Gagliardi, Massimo ^{[1
]}

Rendina, Ivo ^{[1
]}

Cabrini, Stefano ^{[2
]}

Mocella, Vito ^{[1
]}

机构：

[1] CNR, Dept Naples, Inst Microelect & Microsyst, I-80131 Naples, Italy

[2] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA

来源：

LIGHT-SCIENCE & APPLICATIONS | 2012年 / 1卷

关键词：

diffraction gratings; metamaterials; photonic crystals; LIGHT; SURFACES; GRATINGS;

D O I：

10.1038/lsa.2012.42

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this work, we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal (PhC) with negative refractive index behavior. In the frequency range in which the effective refractive index n(eff) is equal to -1, the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial. These modes resemble surface plasmon polariton resonances. This finding was confirmed by ellipsometric measurements, demonstrating the isotropy of the PhC resonances. Such negative index PhC materials may be of use in biosensing applications.

引用

页码：e42 / e42

页数：5

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