Surface roughness effects on the terahertz reflectance of pure explosive materials

被引:83
作者
Ortolani, M. [1 ]
Lee, J. S. [2 ]
Schade, U. [1 ]
Huebers, H. -W. [2 ]
机构
[1] BESSY, D-12489 Berlin, Germany
[2] DLR, D-12489 Berlin, Germany
关键词
D O I
10.1063/1.2973403
中图分类号
O59 [应用物理学];
学科分类号
摘要
We studied the effect of surface roughness on terahertz reflectance spectra of explosives at both quasinormal and oblique incidence by Fourier-transform spectroscopy. The optical constants of 1,3,5,7-tetranitro-1,3,5,7-tetrazacyclooctane and 1,3,5 trinitro-1,3,5 triazacyclohexane were determined from the reflectance spectra of pure optically flat pellets and clear spectral signatures were found in the 0.5-8 THz range. In the case of a realistic surface roughness of several tens of microns, the observation of the spectral signatures at quasinormal incidence is hindered by the specular reflectance roll-off at terahertz frequencies. On increasing the angle of incidence, the roll-off occurred at higher frequency and the surface roughness was optically measured. Oblique incidence geometries can benefit the development of terahertz standoff detection devices. c 2008 American Institute of Physics.
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相关论文
共 17 条
[1]  
Born M, 2005, Principles of optics
[2]   THz spectroscopic investigation of 2,4-dinitrotoluene [J].
Chen, YQ ;
Liu, HB ;
Deng, YQ ;
Schauki, D ;
Fitch, MJ ;
Osiander, R ;
Dodson, C ;
Spicer, JB ;
Shur, M ;
Zhang, XC .
CHEMICAL PHYSICS LETTERS, 2004, 400 (4-6) :357-361
[3]   Time resolved measurements which isolate the mechanisms responsible for terahertz glory scattering from dielectric spheres [J].
Cheville, RA ;
McGowan, RW ;
Grischkowsky, D .
PHYSICAL REVIEW LETTERS, 1998, 80 (02) :269-272
[4]   THE REFLECTION OF ELECTROMAGNETIC WAVES FROM A ROUGH SURFACE [J].
DAVIES, H .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1954, 101 (07) :209-214
[5]   Effects of surface roughness on reflection spectra obtained by terahertz time-domain spectroscopy [J].
Dikmelik, Yamac ;
Spicer, James B. ;
Fitch, Michael J. ;
Osiander, Robert .
OPTICS LETTERS, 2006, 31 (24) :3653-3655
[6]   THz radiation studies on biological systems at the ENEA FEL facility [J].
Doria, A ;
Gallerano, GP ;
Giovenale, E ;
Messina, G ;
Lai, A ;
Ramundo-Orlando, A ;
Sposato, V ;
D'Arienzo, M ;
Perrotta, A ;
Romanò, M ;
Sarti, M ;
Scarfi, MR ;
Spassovsky, I ;
Zeni, O .
INFRARED PHYSICS & TECHNOLOGY, 2004, 45 (5-6) :339-347
[7]   THz imaging and sensing for security applications - explosives, weapons and drugs [J].
Federici, JF ;
Schulkin, B ;
Huang, F ;
Gary, D ;
Barat, R ;
Oliveira, F ;
Zimdars, D .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2005, 20 (07) :S266-S280
[8]   Terahertz spectroscopic investigations of explosives [J].
Hu, Ying ;
Huang, Ping ;
Guo, Lantao ;
Wang, Xiaohong ;
Zhang, Cunlin .
PHYSICS LETTERS A, 2006, 359 (06) :728-732
[9]   Terahertz study of 1,3,5-trinitro-s-triazine by time-domain and Fourier transform infrared spectroscopy [J].
Huang, F ;
Schulkin, B ;
Altan, H ;
Federici, JF ;
Gary, D ;
Barat, R ;
Zimdars, D ;
Chen, M ;
Tanner, DB .
APPLIED PHYSICS LETTERS, 2004, 85 (23) :5535-5537
[10]  
Humlícek J, 2004, THIN SOLID FILMS, V455, P177, DOI 10.1016/j.tsf.2004.01.004