A Physical Verification Methodology for 3D-ICs Using Inductive Coupling

被引:0
作者
Omori, Tatsuo [1 ]
Shiba, Kota [1 ]
Kosuge, Atsutake [2 ]
Hamada, Mototsugu [2 ]
Kuroda, Tadahiro [2 ]
机构
[1] Univ Tokyo, Dept Elect Engn & Informat Syst, Tokyo, Japan
[2] Univ Tokyo, Syst Design Lab, Tokyo, Japan
来源
2021 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS (EDAPS) | 2021年
关键词
ThruChip Interface; 3D-IC; Physical Verification; Inductive Coupling; Automation;
D O I
10.1109/EDAPS53774.2021.9657043
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose a physical verification methodology for 3D-ICs utilizing inductive coupling that includes a verification of the coil polarity and the distance between communicating coils. Additional layout layers are placed on the coils and then verification is done by a program written in SKILL. The proposed method also supports the rotation, flipping, and offset of the stacked chips. By using the proposed methodology in conjunction with commercial verification tools for 3D-ICs, the design efficiency of inductively coupled 3D-ICs is dramatically improved.
引用
收藏
页数:3
相关论文
共 5 条
  • [1] Cadence Design Systems, INN IMPL SYST
  • [2] Lee D.U., 2015, IEEE JSSC
  • [3] 22.1 A 1.1V 16GB 640GB/s HBM2E DRAM with a Data-Bus Window-Extension Technique and a Synergetic On-Die ECC Scheme
    Oh, Chi-Sung
    Chun, Ki Chul
    Byun, Young-Yong
    Kim, Yong-Ki
    Kim, So-Young
    Ryu, Yesin
    Park, Jaewon
    Kim, Sinho
    Cha, Sanguhn
    Shin, Donghak
    Lee, Jungyu
    Son, Jong-Pil
    Ho, Byung-Kyu
    Cho, Seong-Jin
    Kil, Beomyong
    Ahn, Sungoh
    Lim, Baekmin
    Park, Yongsik
    Lee, Kijun
    Lee, Myung-Kyu
    Baek, Seungduk
    Noh, Junyong
    Lee, Jae-Wook
    Lee, Seungseob
    Kim, Sooyoung
    Lim, Botak
    Choi, Seouk-Kyu
    Kim, Jin-Guk
    Choi, Hye-In
    Kwon, Hyuk-Jun
    Kong, Jun Jin
    Sohn, Kyomin
    Kim, Nam Sung
    Park, Kwang-Il
    Lee, Jung-Bae
    [J]. 2020 IEEE INTERNATIONAL SOLID- STATE CIRCUITS CONFERENCE (ISSCC), 2020, : 330 - +
  • [4] Shiba K., 2021, IEEE TCASI
  • [5] QUEST: Multi-Purpose Log-Quantized DNN Inference Engine Stacked on 96-MB 3-D SRAM Using Inductive Coupling Technology in 40-nm CMOS
    Ueyoshi, Kodai
    Ando, Kota
    Hirose, Kazutoshi
    Takamaeda-Yamazaki, Shinya
    Hamada, Mototsugu
    Kuroda, Tadahiro
    Motomura, Masato
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2019, 54 (01) : 186 - 196