Ellipsometric studies of photochromic ultra thin polymer films

被引:2
作者
Knobloch, H
Katholy, S
Orendi, H
Hesse, J
Prescher, D
Brehmer, L
Ruhmann, R
机构
来源
POLARIMETRY AND ELLIPSOMETRY | 1997年 / 3094卷
关键词
ellipsometry; ultra thin films; Langmuir-Blodgett films; polymer films; functionalized polymers;
D O I
10.1117/12.271826
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present ellipsometric measurements on Langmuir-Blodgett (LB) monolayer assemblies of photochromic polymers; the polymer we used was a statistical copolymer with polymethacrylate mainchains and azobenzene sidegroups. Ellipsometry gives a value of n 1.557 for the refractive index and a film thickness of 1.58 nm per monolayer, When exposed to light of appropriate wavelength, the azobenzene groups undergo a trans <-> cis photoisomerisation process which was monitored by ellipsometry. We found an average change in film thickness of 0.02 nm per monolayer during the trans<->cis transition process, whereas the data obtained do not show any significant change in refractive index.
引用
收藏
页码:276 / 280
页数:5
相关论文
empty
未找到相关数据