共 12 条
[1]
*ADV RISC MACH LTD, 1995, ARM7TDM1 DEB ARCH
[2]
AGRAWAL VD, 1994, AT T TECHNICAL J MAR, P30
[4]
A structured and scalable mechanism for test access to embedded reusable cores
[J].
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS,
1998,
:284-293
[5]
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
[J].
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS,
1998,
:204-213
[6]
*SEM IND ASS, 1997, 1997 NAT TECHN ROADM
[7]
A simplified polynomial-fitting algorithm for DAC and ADC BIST
[J].
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY,
1997,
:389-395
[8]
A structured test re-use methodology for core-based system chips
[J].
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS,
1998,
:294-302
[9]
WALLQUIST KM, 1993, INTERNATIONAL TEST CONFERENCE 1993 PROCEEDINGS, P642, DOI 10.1109/TEST.1993.470639
[10]
Test requirements for embedded core based systems and IEEE P1500
[J].
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY,
1997,
:191-199