Impact of laser and X-ray irradiation on C60-films.

被引：0

作者：

Kognovitskii, SO ^{[1
]}

Kamanina, NV ^{[1
]}

Seisyan, RP ^{[1
]}

Gaevski, ME ^{[1
]}

Nesterov, SI ^{[1
]}

Baidakova, MV ^{[1
]}

Rymalis, MR ^{[1
]}

机构：

[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 196140, Russia

来源：

NONRESONANT LASER-MATTER INTERACTION (NLMI-10) | 2001年 / 4423卷

关键词：

fullerenes; X-ray irradiation; thin films;

D O I：

10.1117/12.431208

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The modification of C-60-film structure under laser and X-ray irradiation has been investigated. The wide spectral and dose ranges of irradiation have been applied: from visible light to hard X-ray, and from low to high intensity, when the optical nonlinear effects appear. The structure changes (including the polymerization) manifesting close to nonlinear threshold have been found. They have exhibited the nonreversible effect contribution to the nonlinear parameters of initial C-60-films. The dependence Of C-60-film structure modification on irradiation wavelength has been demonstrated by the photoluminescence and transmission spectral measurements, the solubility controlling, and data of X-ray diffractometery as well. The contribution of X-ray and a secondary electron flow to polymerization of the C-60-film has been determined [1]. The information about C-60-film modification may be used for optical limiting devices and for the development of UV and X-ray resists.

引用

页码：91 / 96

页数：6

共 50 条

[41] Soft X-ray characterisation of organic semiconductor films
McNeill, Christopher R.
Ade, Harald
JOURNAL OF MATERIALS CHEMISTRY C, 2013, 1 (02) : 187 - 201
[42] X-ray diffraction characterization of thin superconductive films
Kozaczek, KJ
Book, GW
Watkins, TR
Carter, WB
NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS VII, PTS 1 AND 2, 1996, 210-2 : 203 - 210
[43] The low temperature symmetry change of C-60: A high resolution X-ray diffraction investigation
Willart, JF
Carpentier, L
Descamps, M
Krane, HG
Sauvajol, JL
SOLID STATE COMMUNICATIONS, 1997, 101 (05) : 319 - 321
[44] Polycrystalline diamond films for X-ray lithography mask
Huang, BR
Wu, CH
Yang, KY
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 75 (01): : 61 - 67
[45] Studies of ion irradiation effects in hydrogenated amorphous carbon thin films by X-ray absorption and photoemission spectroscopy
Ray, S. C.
Kumar, K. P. Krishna
Tsai, H. M.
Chiou, J. W.
Pao, C. W.
Pong, W. F.
Tsai, M. -H.
Wu, B. -H.
Sheu, C. -R.
Chen, C. -C.
Hong, Franklin C. -N.
Cheng, H. -H.
Dalakyan, A.
THIN SOLID FILMS, 2008, 516 (10) : 3374 - 3377
[46] Soft X-ray emission spectroscopy used for the characterization of a-C and CNx thin films
Nepijko, S. A.
Chernenkaya, A.
Medjanik, K.
Chernov, S. V.
Klimenkov, M.
Vlasenko, O. V.
Petrovskaya, S. S.
Odnodvorets, L. V.
Zaulichnyy, Ya. V.
Schoenhense, G.
THIN SOLID FILMS, 2015, 577 : 109 - 113
[47] An X-ray photoelectron spectroscopy study of the hydration of C2S thin films
Rheinheimer, Vanessa
Casanova, Ignasi
CEMENT AND CONCRETE RESEARCH, 2014, 60 : 83 - 90
[48] X-ray diffraction study of crystallographic parameters and Debye temperature of C60 single crystals
Shebanovs, L
Maniks, J
Kalnacs, J
JOURNAL OF CRYSTAL GROWTH, 2002, 234 (01) : 202 - 206
[49] X-ray photoelectron and Hall studies on nanostructured thin films of PbS grown by pulsed laser deposition
Beatriceveena, T., V
Prabhu, E.
Jayaraman, V
Gnanasekar, K., I
MATERIALS LETTERS, 2019, 238 : 324 - 327
[50] Phototransformation of C60 thin films by UV pulsed laser irradiation:: Comparative photoacoustic, AFM, and Raman studies
Alvarez-Zauco, E.
Basiuk , E. V.
Castaneda-Guzman, R.
Sato-Berru, R. Y.
Saniger-Blesa, J. M.
Villagran-Muniz, M.
Banuelos, J. G.
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2007, 7 (4-5) : 1414 - 1418

← 1 2 3 4 5 →