REM study of the Si(III) vicinal surfaces

被引:5
|
作者
Suzuki, T
Yagi, K
机构
[1] Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro
关键词
D O I
10.1142/S0218625X97000523
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this paper, reflection electron microscope (REM) studies of surfaces are briefly reviewed and recent REM studies of Si(111) vicinal surfaces are described. Triple-layer-height steps are formed on the vicinal surfaces inclined by angles of about 1.5-5 degrees toward the [(1) over bar (1) over bar 2] direction. The triple steps are seen below the phase transition temperature between the 7 x 7 and 1 x 1 structures and break into single steps above the phase transition temperature. Vicinal surfaces inclined toward the [11 (2) over bar] direction showed a so-called hill-and-valley structure that is composed of the (111) and an unindexed surface terraces below the phase transition temperature. The hill-and-valley structure disappeared above the phase transition temperature.
引用
收藏
页码:543 / 549
页数:7
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