Growth and characterization of stepwise flash evaporated CuInTe2 thin films

被引：17
作者：
Ananthan, M. R. [1 ]
Kasiviswanathan, S. [1 ]
机构：
[1] Indian Inst Technol, Dept Phys, Madras 600036, Tamil Nadu, India
来源：
SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2009年 / 93卷 / 02期
关键词：
CuInTe2; Thin films; TEM; RBS; Raman spectroscopy; SPECTRA; CU;
D O I：
10.1016/j.solmat.2008.09.024
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
CuInTe2 films grown by stepwise flash evaporation onto glass and silicon substrates held at 573 K were studied using X-ray diffraction (XRD), transmission electron microscopy (TEM), Rutherford back-scattering spectrometry (RBS) and Raman spectroscopy. XRD and TEM studies showed the formation of single-phase polycrystalline CuInTe2. Results of the RBS measurements showed the films to be near-stoichiometric and negligible diffusion of elements across the CuInTe2/Si interface. Various lattice vibrational modes identified by Raman measurements were found to match well with those reported for single-crystal CuInTe2, confirming the crystalline quality of the CuInTe2 thin films. (C) 2008 Elsevier B.V. All rights reserved.
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收藏
页码：188 / 192
页数：5
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