Abnormal Data Analysis in Process Industries Using Deep-Learning Method

被引:0
作者
Song, Wen [1 ]
Weng, Wei [1 ]
Fujimura, Shigeru [1 ]
机构
[1] Waseda Univ, Grad Sch Informat Prod & Syst, Kitakyushu, Fukuoka, Japan
来源
2017 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM) | 2017年
关键词
Data analysis; wavelet-denoising; deep-learning;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This research is mainly about the abnormal data analysis in factories of process industries. In the processing factory, there are many sensors which transmit the values to each other. Workers in process factory need to be alerted when the values of some sensors are abnormal values. In our research, the main target is to detect the potential abnormal value from different sensors of process industries. Since the value is filled with noise and delays, we first use the cross-correlation and wavelet transformation to remove them. Then, use deep-learning method to train the model with processed data and use the model to detect potential abnormal value. Finally, we evaluate the model we trained by the data extracted from a real process factory. The result shows that our model performs well.
引用
收藏
页码:2356 / 2360
页数:5
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