Improvements in the determination of extinction coefficients of a thin film using an envelope method

被引：7

作者：

Kar, M ^{[1
]}

Verma, BS ^{[1
]}

机构：

[1] Natl Phys Lab, Div Elect Mat, New Delhi 110012, India

来源：

JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 2005年 / 7卷 / 10期

关键词：

thin film; optical constants; refractive index; extinction coefficient; envelope method; variational method;

D O I：

10.1088/1464-4258/7/10/012

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The algorithm used in the envelope method has been integrated with a variational method, for accurate determination of the refractive index (it) and extinction coefficient (k) of a weakly absorbing film deposited onto a weakly absorbing thick substrate. The proposed algorithm leads to significant improvement in the degree of accuracy of k values in the medium and weak absorption region down to k similar to 5 x 10(-5).

引用

页码：599 / 603

页数：5

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