Improvements in the determination of extinction coefficients of a thin film using an envelope method

被引：7
作者：
Kar, M [1 ]
Verma, BS [1 ]
机构：
[1] Natl Phys Lab, Div Elect Mat, New Delhi 110012, India
来源：
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 2005年 / 7卷 / 10期
关键词：
thin film; optical constants; refractive index; extinction coefficient; envelope method; variational method;
D O I：
10.1088/1464-4258/7/10/012
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The algorithm used in the envelope method has been integrated with a variational method, for accurate determination of the refractive index (it) and extinction coefficient (k) of a weakly absorbing film deposited onto a weakly absorbing thick substrate. The proposed algorithm leads to significant improvement in the degree of accuracy of k values in the medium and weak absorption region down to k similar to 5 x 10(-5).
引用
收藏
页码：599 / 603
页数：5
相关论文
共 50 条
  • [31] Determination of optical constants and nonlinear optical coefficients of Violet 1-doped polyvinyl alcohol thin film
    HUSSAIN A BADRAN
    ALAA Y AL-AHMAD
    QUSAY M ALI HASSAN
    CHASSIB A EMSHARY
    Pramana, 2016, 86 : 135 - 145
  • [32] Determination of the thickness and optical constants of transparent indium-doped ZnO thin films by the envelope method
    Ilican, S.
    Caglar, M.
    Caglar, Y.
    MATERIALS SCIENCE-POLAND, 2007, 25 (03): : 709 - 718
  • [33] Measurability of the diffusion and surface exchange coefficients using isotope exchange with thin film and traditional samples
    Fischer, Eric
    Hertz, Joshua L.
    SOLID STATE IONICS, 2012, 218 : 18 - 24
  • [34] Determination of the extinction coefficients of CR-39, MR-8, and MR-10 organic glasses in the near-ultraviolet to visible region
    Gambaudo, Noemie
    Twardowski, Patrice
    Pauly, Matthias
    Gerard, Philippe
    Jagu, Romain
    Flury, Manuel
    OPTICAL MATERIALS, 2024, 150
  • [35] Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
    Minkov, D. A.
    Gavrilov, G. M.
    Angelov, V.
    Moreno, J. M. D.
    Vazquez, C. G.
    Ruano, S. M. F.
    Marquez, E.
    THIN SOLID FILMS, 2018, 645 : 370 - 378
  • [36] ZnS Thin Film Prepared by Using Chemical Spray Pyrolysis Method
    Karadeniz, S. Morkoc
    Ekinci, A. E.
    Tuzluca, F. N.
    Ertugrul, M.
    ASIAN JOURNAL OF CHEMISTRY, 2012, 24 (01) : 220 - 222
  • [37] Investigation of phase transformation in thin film using finite element method
    School of Mechanical and Materials Engineering, Washington State University, Pullman
    WA
    99164, United States
    Solid State Phenomena, 2009, (29-41) : 29 - 41
  • [38] Measurement of thin film thermal conductivity using the laser flash method
    Ruoho, Mikko
    Valset, Kjetil
    Finstad, Terje
    Tittonen, Ilkka
    NANOTECHNOLOGY, 2015, 26 (19)
  • [39] A new method of determining the optical constants of a thin film from its reflectance and transmittance interferograms in a wide spectral range:: 0.2-3 μm
    Khashan, MA
    El-Naggar, AM
    Shaddad, E
    OPTICS COMMUNICATIONS, 2000, 178 (1-3) : 123 - 132
  • [40] Measurement of mechanical properties for thin film using visual image tracing method
    Lee, Sang Joo
    Han, Seung Woo
    Kim, Jae Hyun
    Lee, Hak Joo
    ADVANCES IN NANOMATERIALS AND PROCESSING, PTS 1 AND 2, 2007, 124-126 : 1701 - +
12345