Grating couplers for surface plasmons excited on thin metal films in the Kretschmann-Raether configuration

被引:112
作者
Schröter, U
Heitmann, D
机构
[1] Univ Hamburg, Inst Angew Phys, D-20355 Hamburg, Germany
[2] Zentrum Mikrostrukturforsch, D-20355 Hamburg, Germany
来源
PHYSICAL REVIEW B | 1999年 / 60卷 / 07期
关键词
D O I
10.1103/PhysRevB.60.4992
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the optical properties of periodically modulated thin metal films in the Kretschmann-Raether configuration. We find that excitation of surface plasmons via the grating coupler effect at the metal surface not facing the incoming light is not possible in the case of a conformal modulation of the two metal surfaces, but only if the thickness of the metal film is varied over the grating period. In this case there is strong interaction between the surface plasmons on both surfaces and photonic band gaps open up in the dispersion. Whereas in reflection spectra the surface plasmons are seen as minima, they can appear as maxima, minima, or Fano-type resonances in transmission spectra. We show how thin film grating couplers can be tailored to achieve a field strength enhancement at a particular interface or pronounced photonic band gaps. [S0163-1829(99)00931-5].
引用
收藏
页码:4992 / 4999
页数:8
相关论文
共 16 条
  • [11] PETIT R, 1980, TOPICS CURRENT PHYSI, V22
  • [12] Raether H., 1988, SPRINGER TRACTS MODE, V111
  • [13] Surface-plasmon-enhanced transmission through metallic gratings
    Schroter, U
    Heitmann, D
    [J]. PHYSICAL REVIEW B, 1998, 58 (23): : 15419 - 15421
  • [14] Surface plasmon reflection at edges and resonance effects in metal bars
    Schroter, U
    Seider, S
    Tode, S
    Heitmann, D
    [J]. ULTRAMICROSCOPY, 1997, 68 (04) : 223 - 230
  • [15] SCANNING PLASMON NEAR-FIELD MICROSCOPE
    SPECHT, M
    PEDARNIG, JD
    HECKL, WM
    HANSCH, TW
    [J]. PHYSICAL REVIEW LETTERS, 1992, 68 (04) : 476 - 479
  • [16] Single molecule imaging of fluorescently labeled proteins on metal by surface plasmons in aqueous solution
    Yokota, H
    Saito, K
    Yanagida, T
    [J]. PHYSICAL REVIEW LETTERS, 1998, 80 (20) : 4606 - 4609