Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy

被引：39

作者：

de Pablo, PJ ^{[1
]}

Gómez-Navarro, C

Martínez, MT

Benito, AM

Maser, WK

Colchero, J

Gómez-Herrero, J

Baró, AM

机构：

[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, Au Queried Lab Nuevas Microscopias, E-28049 Madrid, Spain

[2] CSIC, Inst Carboquim, E-50015 Zaragoza, Spain

[3] Univ Autonoma Madrid, Dept Fis Mat Condensada, Lab Nuevas Microscopias, E-28049 Madrid, Spain

来源：

APPLIED PHYSICS LETTERS | 2002年 / 80卷 / 08期

关键词：

D O I：

10.1063/1.1453475

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this letter, a method is presented to perform current versus voltage measurements on carbon nanotubes using the tip of a scanning force microscope as an electrode that can be positioned along the molecule, This method allows current versus voltage measurements to be carried out at any spot along a nanotube. By using this method, we present indications of ballistic transport in carbon nanotubes. as well as effects in the electrical properties due to the mechanical deformation. This is a general technique that can be applied to any conducting nanowire. (C) 2002 American Institute of Physics.

引用

页码：1462 / 1464

页数：3

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