Model Reference Adaptive Control for Atomic Force Microscope

被引：0

作者：

Chen, Huang-Chih ^{[1
]}

Fu, Li-Chen ^{[1
]}

机构：

[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan

来源：

2018 INTERNATIONAL AUTOMATIC CONTROL CONFERENCE (CACS) | 2018年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper demonstrates the approach of a direct model reference adaptive control (MRAC) to maintain the constant amplitude of the oscillating Atomic Force Microscope (AFM) cantilever. Compared with PM controllers, the MRAC strategy can improve the scan velocity without losing the image quality.

引用

页数：1