Note: Thickness determination of freestanding ultra-thin foils using a table top laboratory extreme ultraviolet source

被引:7
作者
Braenzel, J. [1 ]
Pratsch, C. [1 ,2 ]
Hilz, P. [3 ]
Kreuzer, C. [3 ]
Schnuerer, M. [1 ]
Stiel, H. [1 ,4 ]
Sandner, W. [1 ]
机构
[1] Max Born Inst Nichtlineare Opt & Kurzzeitspektros, D-12489 Berlin, Germany
[2] Helmholtz Zentrum MZB, D-12489 Berlin, Germany
[3] Univ Munich, D-85748 Garching, Germany
[4] Berlin Lab Innovat Xray Technol BLiX, D-10623 Berlin, Germany
关键词
DYNAMICS; FILMS;
D O I
10.1063/1.4807153
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present a versatile and handy method allowing a thickness determination of freestanding thin plastic foils by its transmission characteristics in the extreme ultraviolet (EUV) spectrum. The method is based on a laser induced plasma source, emitting light in the EUV region, a compact double-mirror EUV monochromator operating at a fixed wavelength of 18.9 nm, and a CCD camera. The measurement delivers transmission values with a standard deviation of Delta T = 0.005 enabling foils thickness characterization with nm-accuracy at a given foil density and stoichiometric composition. Well characterized freestanding ultra-thin foils can be directly implemented in, e. g., high intensity laser matter experiments without further manipulation. (C) 2013 AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4807153]
引用
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页数:3
相关论文
共 15 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]   Laser ion-acceleration scaling laws seen in multiparametric particle-in-cell simulations [J].
Esirkepov, T ;
Yamagiwa, M ;
Tajima, T .
PHYSICAL REVIEW LETTERS, 2006, 96 (10)
[3]   Measurement of sub-nanometer lubricant films using ultra-thin film interferometry [J].
Glovnea, RP ;
Forrest, AK ;
Olver, AV ;
Spikes, HA .
TRIBOLOGY LETTERS, 2003, 15 (03) :217-230
[4]  
HEAVENS OS, 1960, REP PROG PHYS, V23, P2
[5]   Radiation-Pressure Acceleration of Ion Beams Driven by Circularly Polarized Laser Pulses [J].
Henig, A. ;
Steinke, S. ;
Schnuerer, M. ;
Sokollik, T. ;
Hoerlein, R. ;
Kiefer, D. ;
Jung, D. ;
Schreiber, J. ;
Hegelich, B. M. ;
Yan, X. Q. ;
Meyer-ter-Vehn, J. ;
Tajima, T. ;
Nickles, P. V. ;
Sandner, W. ;
Habs, D. .
PHYSICAL REVIEW LETTERS, 2009, 103 (24)
[6]  
Henke B. L., 2012, XRAY INTERACTIONS MA
[7]   Dynamics of nanometer-scale foil targets irradiated with relativistically intense laser pulses [J].
Hoerlein, R. ;
Steinke, S. ;
Henig, A. ;
Rykovanov, S. G. ;
Schnuerer, M. ;
Sokollik, T. ;
Kiefer, D. ;
Jung, D. ;
Yan, X. Q. ;
Tajima, T. ;
Schreiber, J. ;
Hegelich, M. ;
Nickles, P. V. ;
Zepf, M. ;
Tsakiris, G. D. ;
Sandner, W. ;
Habs, D. .
LASER AND PARTICLE BEAMS, 2011, 29 (04) :383-388
[8]   Facile measurement of polymer film thickness ranging from nanometer to micrometer scale using atomic force microscopy [J].
Hong, Xiaodong ;
Gan, Yang ;
Wang, You .
SURFACE AND INTERFACE ANALYSIS, 2011, 43 (10) :1299-1303
[9]   Spatial and spectral characterization of a laser produced plasma source for extreme ultraviolet metrology [J].
Legall, H ;
Stiel, H ;
Vogt, U ;
Schönnagel, H ;
Nickles, PV ;
Tümmler, J ;
Scholz, F ;
Scholze, F .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (11) :4981-4988
[10]   Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives [J].
Losurdo, Maria ;
Bergmair, Michael ;
Bruno, Giovanni ;
Cattelan, Denis ;
Cobet, Christoph ;
de Martino, Antonello ;
Fleischer, Karsten ;
Dohcevic-Mitrovic, Zorana ;
Esser, Norbert ;
Galliet, Melanie ;
Gajic, Rados ;
Hemzal, Dusan ;
Hingerl, Kurt ;
Humlicek, Josef ;
Ossikovski, Razvigor ;
Popovic, Zoran V. ;
Saxl, Ottilia .
JOURNAL OF NANOPARTICLE RESEARCH, 2009, 11 (07) :1521-1554