Studies of dielectric relaxation and impedance analysis of new electronic material: (Sb1/2Na1/2)(Fe2/3Mo1/3)O3

A new polycrystalline ceramic sample of (Sb1/2Na1/2)(Fe2/3Mo1/3)O-3 is formed by cheap mixed oxide processing technique. The mass loss and the calcination temperature of the sample are optimized by thermogravimetric analysis and repeated firing. The formed sample crystallizes in the orthorhombic crystal structure at room temperature depicted from the X-ray diffraction spectra. The dielectric relaxation, impedance and modulus analysis of the sample have been analyzed in various temperature and frequency range. The dielectric parameters of the sample depend on frequency and temperature and with an increment in temperature the relaxation time falls. Impedance spectroscopy analysis predicts the association of grain and grain boundary resistance. The short and long-range mobility of the charge carriers are illustrated by the modulus plot. Ac conductivity is seen to be temperature and frequency dependent and hopping of the charge carriers is also observed at high temperature. Further, the universal power law is followed by ac conductivity mechanism.