Yield prediction by sampling with the EYES tool

被引：6

作者：

Allan, GA

Walton, AJ

机构：

来源：

1996 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 1996年

关键词：

D O I：

10.1109/DFTVS.1996.571983

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper reports a software system EYES (Edinburgh Yield Estimator Sampling) for the yield prediction of ULSI devices. The system implements the survey sampling based methodology for critical area estimation and yield prediction. This methodology Is not limited by the size of the device or the design hierarchy and can provide yield predictions in a reasonable time for even the largest devices, using modest computing resources.

引用

页码：39 / 47

页数：9