Effects of growth conditions on structure and dielectric properties of bismuth-magnesium niobate thin films

被引:2
作者
Gao Libin [1 ]
Jiang Shuwen [1 ]
Li Yanrong [1 ]
机构
[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
来源
18TH INTERNATIONAL VACUUM CONGRESS (IVC-18) | 2012年 / 32卷
关键词
cubic pyrochlore; Bi1.5MgNb1.5O7 thin films; tunability; dielectric loss; TUNABILITY;
D O I
10.1016/j.phpro.2012.03.566
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The Bi1.5MgNb1.5O7 (BMN) thin films were prepared on platinum coated sapphire by rf magnetron sputtering deposition. Effects of substrate temperature, sputtering ambient and post rapid thermal annealing on structure, morphologies, and dielectric properties of films were investigated. Thin films have cubic pyrochlore structure when substrate temperature at 650 degrees C or higher. Corresponding to tunable dielectric properties of bismuth based cubic pyrochlore thin films, voltage tunability of Bi1.5MgNb1.5O7 thin films increases with substrate temperature. Bi1.5MgNb1.5O7 thin films exhibit low dielectric loss of similar to 0.0018-0.004. A brief discussion is given on the enhanced tunability of Bi1.5MgNb1.5O7 thin films. The relatively high tunability and low dielectric loss suggest that Bi1.5MgNb1.5O7 thin films have potential application for tunable capacitor applications.
引用
收藏
页码:340 / 344
页数:5
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