Swift heavy ions induced nano-grain fragmentation in fluoride thin films

被引：14

作者：

Kumar, Manvendra ^{[1
]}

Pandey, Ratnesh K. ^{[1
,4
]}

Rajput, Parasmani ^{[2
]}

Khan, S. A. ^{[3
]}

Singh, Fouran ^{[3
]}

Avasthi, D. K. ^{[3
,5
]}

Pandey, Avinash C. ^{[1
]}

机构：

[1] Univ Allahabad, Nanotechnol Applicat Ctr, Allahabad 211002, Uttar Pradesh, India

[2] Bhabha Atom Res Ctr, Atom & Mol Phys Div, Mumbai 400085, Maharashtra, India

[3] Inter Univ Accelerator Ctr, Post Box 10502, New Delhi 110067, India

[4] Univ Petr & Energy Studies, Coll Engn Studies, Dept Phys, Dehra Dun 248007, Uttar Pradesh, India

[5] Amity Univ, Noida 201303, India

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2017年 / 695卷

关键词：

Nanograin fragmentation; Thin films; Swift heavy ions; Track radius; Thermal spike; Fluoride; ENHANCED ELECTRON INJECTION; LITHIUM-FLUORIDE; OPTICAL MODIFICATIONS; TRACK FORMATION; COLOR-CENTERS; IRRADIATION; DAMAGE; NANOSTRUCTURES; DEVICES; GROWTH;

D O I：

10.1016/j.jallcom.2016.10.125

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Influence of the swift heavy ions (SHIs) at various ion fluences in nanodimensional polycrystalline fluoride thin films (LiF, CaF2 and BaF2) were investigated by glancing angle X-ray diffraction (GAXRD), complemented by atomic force microscopy (AFM). Nano-grain fragmentation is observed with increasing ion fluences as evident from the increase of the peak width in GAXRD pattern. It is also observed that after certain fluence SHIs irradiation, there is a saturation in the nano-grain fragmentation. The track radius and damage cross section are deduced from peak width and area of the dominant diffraction. The track radii are 5.5 and 14.5 nm, 5.0 and 9.7 nm and 5.5 and 6.5 nm for BaF2, LiF, CaF2, deduced from width and area, respectively. It is noteworthy that the track radius is found to be higher than the previously estimated from sputtering studies of LiF thin films. (C) 2016 Elsevier B.V. All rights reserved.

引用

页码：83 / 90

页数：8

共 64 条

[11] Swift heavy ion irradiation induced phase transformation in undoped and niobium doped titanium dioxide composite thin films [J].

Gautam, Subodh K. ;

Chettah, Abdelhak ;

Singh, R. G. ;

Ojha, Sunil ;

Singh, Fouran .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2016, 379 :224-229

[12] Shape transformation of Sn nanocrystals induced by swift heavy-ion irradiation and the necessity of a molten ion track [J].

Giulian, R. ;

Kremer, F. ;

Araujo, L. L. ;

Sprouster, D. J. ;

Kluth, P. ;

Fichtner, P. F. P. ;

Byrne, A. P. ;

Ridgway, M. C. .

PHYSICAL REVIEW B, 2010, 82 (11)

[13] Generation and control of high-order harmonics by the interaction of an infrared laser with a thin graphite layer [J].

Gupta, AK ;

Alon, OE ;

Moiseyev, N .

PHYSICAL REVIEW B, 2003, 68 (20)

[14] The structure and composition of lithium fluoride films grown by off-axis pulsed laser ablation [J].

Henley, SJ ;

Ashfold, MNR ;

Pearce, SRJ .

APPLIED SURFACE SCIENCE, 2003, 217 (1-4) :68-77

[15] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].

Horcas, I. ;

Fernandez, R. ;

Gomez-Rodriguez, J. M. ;

Colchero, J. ;

Gomez-Herrero, J. ;

Baro, A. M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)

[16] Enhanced electron injection in organic electroluminescence devices using an Al/LiF electrode [J].

Hung, LS ;

Tang, CW ;

Mason, MG .

APPLIED PHYSICS LETTERS, 1997, 70 (02) :152-154

[17] Highly efficient and bright organic electroluminescent devices with an aluminum cathode [J].

Jabbour, GE ;

Kawabe, Y ;

Shaheen, SE ;

Wang, JF ;

Morrell, MM ;

Kippelen, B ;

Peyghambarian, N .

APPLIED PHYSICS LETTERS, 1997, 71 (13) :1762-1764

[18] Modification of nanostructures by high-energy ion beams [J].

Klaumünzer, S .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 244 (01) :1-7

[19] DRAMATIC GROWTH OF GLASSY PD80SI20 DURING HEAVY-ION IRRADIATION [J].

KLAUMUNZER, S ;

SCHUMACHER, G .

PHYSICAL REVIEW LETTERS, 1983, 51 (21) :1987-1990

[20] Ordering of fullerene and carbon nanotube thin films under energetic ion impact [J].

Kumar, Amit ;

Avasthi, D. K. ;

Pivin, J. C. ;

Koinkar, P. M. .

APPLIED PHYSICS LETTERS, 2008, 92 (22)

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