Analytical current-voltage relations for compact SiGe HBT models - Part I: The "idealized" HBT

被引:5
|
作者
Friedrich, M [1 ]
Rein, HM [1 ]
机构
[1] Ruhr Univ Bochum, AG Halbleiterbauelemente, D-44780 Bochum, Germany
关键词
bipolar transistor modeling; compact HBT model; SiGe heterojunction bipolar transistors;
D O I
10.1109/16.772480
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Based on the generalized integral charge control relation (GICCR) presented in [1], analytical current-voltage relations for "true" SiGe heterojunction bipolar transistors (HBT's) are derived, which are well suited for compact physically based transistor models, For this, the weighted minority charge in the collector, which proved to be of dominating influence at high current densities, is calculated from simple physical expressions. They contain the operating point as well as physical and technological parameters. The model equations, which serve as a basis for a new physically based compact SiGe HBT model called SIGEM, are verified up to high current densities by numerical device simulations. It is shown that not only the static behavior but also the small-signal parameters y(21) and y(22), which are more sensitive to potential model errors, are well described even far within the high-current region. In this first part of the paper, the work is restricted to HBT's with idealized and simplified doping profile. In the second part [2] it is shown how these equations can also be applied to HBT's with modified, more practical doping profiles and how the model parameters can be extracted.
引用
收藏
页码:1384 / 1393
页数:10
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