X-ray excited spectroscopy of defects and impurities in compound semiconductors

被引：1

作者：

Takeda, Y ^{[1
]}

机构：

[1] Nagoya Univ, Dept Mat Sci & Engn, Grad Sch Engn, Nagoya, Aichi 4648603, Japan

[2] Nagoya Univ, Venture Business Lab, Nagoya, Aichi 4648603, Japan

[3] JST, CREST, Kawaguchi, Saitama 3320012, Japan

来源：

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 2003年 / 6卷 / 5-6期

关键词：

XAFS; impurity; local structure; fluorescence X-ray; photoluminescence; capacitance;

D O I：

10.1016/j.mssp.2003.07.001

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Analysis of local structures around impurities and defects in compound semiconductors and insulator by X-ray excited spectroscopy, namely, XAFS with fluorescence X-ray detection technique (fluorescence-XAFS) and with photoluminescence detection technique (PL-XAFS), is presented. Those two techniques that use the surface incidence and surface detection are essentially important for samples with a thin epitaxial layer, where the impurities and defects exist, grown on a thick substrate. Er in InP, Er and O in GaAs, Tb in SiO2 and DX-center in GaAs are taken as examples and local structures around these impurities are elucidated. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：267 / 271

页数：5

共 50 条

[41] X-ray multi-probe data acquisition: A novel technique for laser pump x-ray transient absorption spectroscopy
Kinigstein, Eli D.
Jennings, Guy
Kurtz, Charles A.
March, Anne Marie
Zuo, Xiaobing
Chen, Lin X.
Attenkofer, Klaus
Zhang, Xiaoyi
REVIEW OF SCIENTIFIC INSTRUMENTS, 2021, 92 (08)
[42] Electronic structure and optical properties of CdSxSe1-x solid solution nanostructures from X-ray absorption near edge structure, X-ray excited optical luminescence, and density functional theory investigations
Murphy, M. W.
Yiu, Y. M.
Ward, M. J.
Liu, L.
Hu, Y.
Zapien, J. A.
Liu, Yingkai
Sham, T. K.
JOURNAL OF APPLIED PHYSICS, 2014, 116 (19)
[43] Scanning x-ray excited optical luminescence of heterogeneity in halide perovskite alloys
Dolan, Connor J.
Cakan, Deniz N.
Kumar, Rishi E.
Kodur, Moses
Palmer, Jack R.
Luo, Yanqi
Lai, Barry
Fenning, David P.
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2023, 56 (03)
[44] A Review on X-ray Excited Emission Decay Dynamics in Inorganic Scintillator Materials
Kumar, Vineet
Luo, Zhiping
PHOTONICS, 2021, 8 (03) : 1 - 27
[45] Pressure study of monoclinic ReO2 up to 1.2 GPa using X-ray absorption spectroscopy and X-ray diffraction
Ferreira, Fabio Furlan
Correa, Hamilton P. S.
Orlando, Marcos T. D.
Passamai, Jose L., Jr.
Orlando, Cintia G. P.
Cavalcante, Isabela P.
Garcia, Flavio
Tamura, Edilson
Martinez, Luis G.
Rossi, Jesualdo L.
de Melo, Francisco C. L.
JOURNAL OF SYNCHROTRON RADIATION, 2009, 16 : 48 - 56
[46] Structural properties of low-temperature grown ZnO thin films determined by X-ray diffraction and X-ray absorption spectroscopy
Yu, Chung-Jong
Sung, Nark-Eon
Lee, Han-Koo
Shin, Hyun-Joon
Yun, Young-Duck
Kang, Seen-Woong
Lee, Ik-Jae
THIN SOLID FILMS, 2011, 519 (13) : 4366 - 4370
[47] Site-selective X-ray absorption spectroscopy of cobalt nanoparticles
Kuehn, Timna-Josua
Caliebe, Wolfgang
Matoussevitch, Nina
Boennemann, Helmut
Hormes, Josef
APPLIED ORGANOMETALLIC CHEMISTRY, 2011, 25 (08) : 577 - 584
[48] A hydrothermal apparatus for x-ray absorption spectroscopy of hydrothermal fluids at DESY
Klemme, S.
Feldhaus, M.
Potapkin, V
Wilke, M.
Borchert, M.
Louvel, M.
Loges, A.
Rohrbach, A.
Weitkamp, P.
Welter, E.
Kokh, M.
Schmidt, C.
Testemale, D.
REVIEW OF SCIENTIFIC INSTRUMENTS, 2021, 92 (06)
[49] The characterisation of solids by nuclear magnetic resonance and X-ray absorption spectroscopy
Chadwick, Alan V.
MOLECULAR SIMULATION, 1998, 21 (2-3) : 105 - 126
[50] Molecular characterization of copper in soils using X-ray absorption spectroscopy
Strawn, Daniel G.
Baker, Leslie L.
ENVIRONMENTAL POLLUTION, 2009, 157 (10) : 2813 - 2821

← 1 2 3 4 5 →