Influence of HiPIMS pulse widths on the deposition behaviour and properties of CuAgZr compositionally graded films

被引:15
作者
Lapeyre, L. [1 ,4 ]
Wieczerzak, K. [2 ]
Hain, C. [1 ,2 ]
Metzger, J. [3 ]
Sharma, A. [2 ]
Bensaoula, A. [1 ,3 ]
Michler, J. [2 ]
Nelis, T. [1 ,2 ]
机构
[1] Bern Univ Appl Sci, Inst Appl Laser Photon & Surface Technol ALPS, Quellgasse 21, CH-2502 Biel, Switzerland
[2] Empa, Swiss Fed Labs Mat Sci & Technol, Lab Mech Mat & Nanostruct, Feuerwerkerstr 39, CH-3602 Thun, Switzerland
[3] Tofwerk AG, Schorenstr 39, CH-3645 Thun, Switzerland
[4] Feuerwerkerstr 39, CH-3603 Thun, Switzerland
关键词
CuAgZr system; Metallic glasses; HiPIMS; Plasma diagnostics; Material characterisation; BULK METALLIC-GLASS; MECHANICAL-PROPERTIES; ANTIMICROBIAL PROPERTIES; SURGICAL BLADE; SYSTEM;
D O I
10.1016/j.surfcoat.2022.129002
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, the influence of different pulse widths (25, 50 and 100 mu s) during high power impulse magnetron sputtering (HiPIMS) of copper, silver and zirconium was investigated in terms of plasma properties and prop-erties of combinatorial composition gradient CuAgZr film libraries. In situ plasma diagnostics via optical emis-sion spectroscopy (OES), time-of-flight mass spectrometry (TOFMS), and modified quartz crystal microbalance (m-QCM), followed by film ex situ X-ray diffraction (XRD) and scanning electron microscopy (SEM) in-vestigations allowed to determine the effect of deposition parameters on the thin films' microstructural changes. Changing the pulse width, while keeping the duty cycle constant, modified the discharge composition in the target region and the ionised fraction of the sputtered species in the substrate region. The maximum Cu ionised fraction (19 %) was found for 50 mu s, resulting in compact and smooth morphology for Cu-rich films, whereas short 25 mu s pulses provided porous columnar films with rough surfaces, as the result from Ar+ bombardment. For Ag-rich films, Ag segregation allowed the deposition of dense layers, regardless of the used pulse width. Furthermore, low Ag (<10 at.%) CuAgZr films produced via HiPIMS and direct-current magnetron sputtering (DCMS) were compared in terms of structural and mechanical property changes as a function of Zr contents. For the studied chemical composition range, a linear relationship between Zr content, XRD phase shift and me-chanical properties was observed for HiPIMS films, in contrast to DCMS's more abrupt transitions. An increase in hardness and elastic modulus (up to 44 % and 22 %, respectively) was found for the HiPIMS films compared to DCMS ones. The obtained results highlight HiPIMS's flexibility in providing a wide range of tailoring possibilities to meet specific application requirements, such as crystalline microstructure, density and associated mechanical properties.
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页数:10
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