Dynamical study of single silver atoms on Si(111)-7 x 7 surfaces

被引:8
|
作者
Ho, MS [1 ]
Su, CC
Tsong, TT
机构
[1] Natl Chung Hsing Univ, Dept Phys, Ctr Nanosci & Nanotechnol, Taichung 402, Taiwan
[2] Acad Sinica, Inst Phys, Taipei 115, Taiwan
关键词
scanning tunneling microscopy; silver; diffusion;
D O I
10.1143/JJAP.45.2382
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dynamics and interactions of silver atoms on Si( 11 l)-7 x 7 Surfaces are investigated using variable-temperature scanning tunneling microscopy (STM). The activation energies and pre-exponential factors upon the room temperature are estimated to be 0.81 and 0.9eV, and 10(9.65) and 10(10.68) for the hopping out of the faulted halves and for hopping out of unfaulted halves, respectively. The behavior exhibited by two silver atoms that jump into a single half-Unit Cell is also addressed. Details of the tracking of single silver atom, that hop within a 7 x 7 half-unit cell are reexamined at similar to 80K using low-temperature STM. The analytical data revealed that silver atoms diffuse within a 7 x 7 unit cells via a corner adatom-rest atom-center adatom-rest atom-corner adatom diffusion pathway in a faulted half under the stress associated with 7 x 7 reconstruction.
引用
收藏
页码:2382 / 2385
页数:4
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