Correlating the interface structure to spin injection in abrupt Fe/GaAs(001) films

被引:22
作者
Fleet, L. R. [1 ]
Yoshida, K. [2 ,3 ,4 ]
Kobayashi, H. [5 ]
Kaneko, Y. [5 ]
Matsuzaka, S. [5 ]
Ohno, Y. [5 ]
Ohno, H. [5 ]
Honda, S. [6 ]
Inoue, J. [7 ]
Hirohata, A. [8 ,9 ]
机构
[1] Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England
[2] Nagoya Univ, Dept Crystalline Mat Sci, Nagoya, Aichi 4648603, Japan
[3] Nagoya Univ, Ecotopia Sci Inst, Nagoya, Aichi 4648603, Japan
[4] Japan Fine Ceram Ctr, Nanostruct Res Lab, Nagoya, Aichi 4568587, Japan
[5] Tohoku Univ, Res Inst Elect Commun, Sendai, Miyagi 9808577, Japan
[6] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan
[7] Nagoya Univ, Dept Appl Phys, Nagoya, Aichi 4648603, Japan
[8] Univ York, Dept Elect, York YO10 5DD, N Yorkshire, England
[9] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
基金
英国工程与自然科学研究理事会;
关键词
TRANSPORT; SILICON; SPINTRONICS;
D O I
10.1103/PhysRevB.87.024401
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Understanding the effect of the interface on electrical spin injection is of great importance for the development of semiconductor spintronics. Fe/GaAs(001) is one of the leading systems for exploring these effects due to the small lattice mismatch. We report on the correlation between the experimentally observed Fe/GaAs(001) interface with the spin-transport properties. Using high-angle annular dark-field scanning transmission electron microscopy, we observe a predominantly abrupt interface with some regions of partial mixing also observed in the same film. We report that reproducible behavior with no bias-dependent polarization inversion was achieved for three-terminal devices. Using ab initio calculations of the experimentally observed interfaces, we show that the contribution to the transport from minority carriers is strongly dependent on the interface structure. DOI: 10.1103/PhysRevB.87.024401
引用
收藏
页数:5
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