modeling;
radiation effects;
radiation hardening;
silicon;
solar cells;
D O I:
10.1109/16.792008
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
An accurate radiation degradation model, based on measured radiation damages to devices and physical principles on radiation-induced defects in Si, has been established to improve the radiation-resistance of the Czochralski (CZ)-grown and floating-zone (FZ)-grown single-crystal Si space solar cells. me have successfully carried out the optimization of radiation-resistant Si space solar cells by. taking into account the effective base carrier concentration dependence of the most important analytical parameters, damage coefficient K-L for the minority-carrier diffusion length and carrier removal rate Re for majority-carrier, The model can be used to adequately predict the radiation degradation of the Si solar cells irradiated with a complete spectrum of electrons fluence. It has been established that the radiation-resistance of the silicon solar cell is very dependent on effective carrier concentration under high fluence range and irradiation tolerance can be improved further by varying the base carrier concentration upon irradiation.