Universal Quantum Gate Set Approaching Fault-Tolerant Thresholds with Superconducting Qubits

被引：280

作者：

Chow, Jerry M. ^{[1
]}

Gambetta, Jay M. ^{[1
]}

Corcoles, A. D. ^{[1
]}

Merkel, Seth T. ^{[1
]}

Smolin, John A. ^{[1
]}

Rigetti, Chad ^{[1
]}

Poletto, S. ^{[1
]}

Keefe, George A. ^{[1
]}

Rothwell, Mary B. ^{[1
]}

Rozen, J. R. ^{[1
]}

Ketchen, Mark B. ^{[1
]}

Steffen, M. ^{[1
]}

机构：

[1] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA

来源：

PHYSICAL REVIEW LETTERS | 2012年 / 109卷 / 06期

关键词：

PHASE QUBITS;

D O I：

10.1103/PhysRevLett.109.060501

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We use quantum process tomography to characterize a full universal set of all-microwave gates on two superconducting single-frequency single-junction transmon qubits. All extracted gate fidelities, including those for Clifford group generators, single-qubit pi/4 and pi/8 rotations, and a two-qubit controlled-NOT, exceed 95% (98%), without (with) subtracting state preparation and measurement errors. Furthermore, we introduce a process map representation in the Pauli basis which is visually efficient and informative. This high-fidelity gate set serves as a critical building block towards scalable architectures of superconducting qubits for error correction schemes and pushes up on the known limits of quantum gate characterization.

引用

页数：5

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