Fabrication of specimens of metamorphic magnetite crystals for field ion microscopy and atom probe microanalysis

被引:24
作者
Kuhlman, KR
Martens, RL
Kelly, TF
Evans, ND
Miller, MK
机构
[1] CALTECH, Jet Prop Lab, In Situ Instruments Grp, Device Res & Applicat Sect, Pasadena, CA 91109 USA
[2] Imago Sci Instruments Corp, Madison, WI 53719 USA
[3] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA
[4] Oak Ridge Natl Lab, Div Met & Ceram, Microscopy & Microanalyt Sci Grp, Oak Ridge, TN 37831 USA
基金
美国国家航空航天局;
关键词
oxide; magnetite; field ion microscopy; atom probe microanalysis; focused ion beam; sample preparation;
D O I
10.1016/S0304-3991(01)00116-4
中图分类号
TH742 [显微镜];
学科分类号
摘要
Field ion specimens have been successfully fabricated from samples of metamorphic magnetite crystals (Fe3O4) extracted from a polymetamorphosed, granulite-facies marble with the use of a focused ion beam. These magnetite crystals contain nanometer-scale, disk-shaped inclusions making this magnetite particularly attractive for investigating the capabilities of atom probe field ion microscopy (APFIM) for geological materials. Field ion microscope images of these magnetite crystals were obtained in which the observed size and morphology of the precipitates agree with previous results. Samples were analyzed in the energy compensated optical position-sensitive atom probe. Mass spectra were obtained in which peaks for singly ionized O-16, Fe-56 and (FeO)-Fe-56 and doubly ionized Fe-54, Fe-56 and Fe-57 peaks were fully resolved. Manganese and aluminum were observed in a limited analysis of a precipitate in an energy compensated position sensitive atom probe. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:169 / 176
页数:8
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