Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene (vol 108, 196102, 2012)

被引：22

作者：

Meyer, Jannik C.

Eder, Franz

Kurasch, Simon

Skakalova, Viera

Kotakoski, Jani

Park, Hye Jin

Roth, Siegmar

Chuvilin, Andrey

Eyhusen, Soeren

Benner, Gerd

Krasheninnikov, Arkady V.

Kaiser, Ute

机构：

来源：

PHYSICAL REVIEW LETTERS | 2013年 / 110卷 / 23期

关键词：

D O I：

10.1103/PhysRevLett.110.239902

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

[No abstract available]

引用

页数：1

共 2 条

[1] Electron knock-on damage in hexagonal boron nitride monolayers [J].

Kotakoski, J. ;

Jin, C. H. ;

Lehtinen, O. ;

Suenaga, K. ;

Krasheninnikov, A. V. .

PHYSICAL REVIEW B, 2010, 82 (11)

[2] Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene [J].

Meyer, Jannik C. ;

Eder, Franz ;

Kurasch, Simon ;

Skakalova, Viera ;

Kotakoski, Jani ;

Park, Hye Jin ;

Roth, Siegmar ;

Chuvilin, Andrey ;

Eyhusen, Soeren ;

Benner, Gerd ;

Krasheninnikov, Arkady V. ;

Kaiser, Ute .

PHYSICAL REVIEW LETTERS, 2012, 108 (19)

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