Dielectric studies of vacuum-evaporated CeF3 thin films

被引:0
作者
Gowtham, M [1 ]
Kim, DY [1 ]
Mangalaraj, D [1 ]
Yi, J [1 ]
机构
[1] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
关键词
ionic conductivity; dielectric loss; dielectric relaxation; oxygen sensor; modulus spectra;
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Cerium-fluoride thin films were prepared by using the vacuum thermal evaporation method. At/CeF3/Al (metal-solid electrolyte-metal) sandwich structure was formed on glass substrates, for the study of the AC conduction mechanism. The impedance analysis was performed in the frequency range from 42 Hz to 5 MHz and in the temperature range from 303 to 403 K. The F- ion conduction through the grain and the grain boundary was analyzed. The modulus and the dielectric spectra analyses revealed the non-Debye nature and the distribution of relaxation times in these films.
引用
收藏
页码:911 / 914
页数:4
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