A DC Arc Model for Series Faults in Low Voltage Microgrids

被引：104

作者：

Uriarte, Fabian M. ^{[1
]}

Gattozzi, Angelo L. ^{[1
]}

Herbst, John D. ^{[1
]}

Estes, Hunter B. ^{[1
]}

Hotz, Thomas J. ^{[1
]}

Kwasinski, Alexis ^{[2
]}

Hebner, Robert E. ^{[1
]}

机构：

[1] Univ Texas Austin, Ctr Electromech, Austin, TX 78705 USA

[2] Univ Texas Austin, Elect & Comp Engn Dept, Austin, TX 78712 USA

来源：

IEEE TRANSACTIONS ON SMART GRID | 2012年 / 3卷 / 04期

关键词：

Arc; computer; dc; energy; fault; flash; hazard; microgrid; model; power; series; simulation; transient;

D O I：

10.1109/TSG.2012.2201757

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a dc arc model to simplify the study of a critical issue in dc microgrids: series faults. The model is derived from a hyperbolic approximation of observed arc voltage and current patterns, which permit analyzing the arc in terms of its resistance, power, energy, and quenching condition. Recent faults staged by the authors on a dc microgrid yielded enough data to develop an arc model for three fault types: constant-gap speed, fixed-gap distance, and accelerated gap. The results in this paper compare experimental and simulation results for the three fault types. It is concluded that because the instantaneous voltage, current, power, and energy waveforms produced by the model agree well with experimental results, the model is suitable for transient simulations.

引用

页码：2063 / 2070

页数：8

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