Polynomial force approximations and multifrequency atomic force microscopy

被引:9
|
作者
Platz, Daniel [1 ]
Forchheimer, Daniel [1 ]
Tholen, Erik A. [2 ]
Haviland, David B. [1 ]
机构
[1] KTH Royal Inst Technol, Sect Nanostruct Phys, Albanova Univ Ctr, SE-10691 Stockholm, Sweden
[2] Intermodulat Prod AB, SE-16958 Solna, Sweden
来源
BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 2013年 / 4卷
基金
瑞典研究理事会;
关键词
AFM; atomic force microscopy; force spectroscopy; multifrequency; intermodulation; polynomial; RESOLUTION; MOTION; MODELS;
D O I
10.3762/bjnano.4.41
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy (ADFS). Based on polynomial force reconstruction we generate high-resolution surface-property maps of polymer blend samples. The polynomial method is described as a special example of a more general approximative force reconstruction, where the aim is to determine model parameters that best approximate the measured force spectrum. This approximative approach is not limited to spectral data, and we demonstrate how it can be adapted to a force quadrature picture.
引用
收藏
页码:352 / 360
页数:9
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