Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopy

被引：11
|
作者：
Song, Hyunwook [1 ]
Lee, Hyoyoung [2 ]
Lee, Takhee [1 ]
机构：
[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea
[2] Ctr Smart Mol Memory, Natl Creat Res Inst, IT Convergence Components Lab, Elect & Telecommunicat Res Inst, Taejon 305350, South Korea
来源：
ULTRAMICROSCOPY | 2008年 / 108卷 / 10期
关键词：
self-assembled monolayers; conducting atomic force microscopy; molecular electronics; tunneling;
D O I：
10.1016/j.ultramic.2008.04.016
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We report on a tip-loading force-dependent tunneling behavior through alkanethiol self-assembled monolayers formed in metal-molecule-metal junctions, using conducting atomic force microscopy. The metal-molecule contacts were formed by placing a conductive tip in a stationary point contact on alkanethiol self-assembled monolayers under a controlled tip-loading force. Current-voltage characteristics in the alkanethiol junctions are simultaneously measured, while varying the loading forces. Tunneling current through the alkanethiol junctions increases and decay coefficient beta(N) decreases, respectively, with increasing tip-loading force, which results from enhanced intermolecular charge transfer in a tilted molecular configuration Under the tip-loading effect. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码：1196 / 1199
页数：4
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