Dopant Distributions in PbTe-Based Thermoelectric Materials

被引：24

作者：

Blum, Ivan D. ^{[1
]}

Isheim, Dieter ^{[1
,2
]}

Seidman, David N. ^{[1
,2
]}

He, Jiaqing ^{[1
]}

Androulakis, John ^{[3
]}

Biswas, Kanishka ^{[3
]}

Dravid, Vinayak P. ^{[1
]}

Kanatzidis, Mercouri G. ^{[3
]}

机构：

[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA

[2] Northwestern Univ, Ctr Atom Probe Tomog, Evanston, IL 60208 USA

[3] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA

来源：

JOURNAL OF ELECTRONIC MATERIALS | 2012年 / 41卷 / 06期

关键词：

PbTe; Na; K; precipitates; atom-probe tomography; ATOM; NANOSTRUCTURES;

D O I：

10.1007/s11664-012-1972-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Atom-probe tomography (APT) is utilized to characterize the dopant distribution in two thermoelectric materials systems: (1) PbTe-2 mol.%SrTe-1 mol.%Na2Te, and (2) codoped PbTe-1.25 mol.%K-1.4 mol.%Na. We observe the presence of Na-rich precipitates of a few nanometers in diameter in both systems. Both concentration frequency distribution analyses and partial radial distribution functions are employed to analyze the tendency for dopant clustering detected by APT. In the codoped sample, K accumulates significantly in Na-rich precipitates, while in the Sr-containing sample, Sr is homogeneously distributed. High-resolution transmission electron microscopy also reveals the presence of precipitates having platelet morphology, which are oriented parallel to the {001} planes.

引用

页码：1583 / 1588

页数：6

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