Composition-dependent structural and electrical properties of PbSe1-xTex thin films

被引：24

作者：

Hmood, A. ^{[1
]}

Kadhim, A. ^{[1
]}

Abu Hassan, H. ^{[1
]}

机构：

[1] Univ Sains Malaysia, Sch Phys, Minden 11800, Penang, Malaysia

来源：

SUPERLATTICES AND MICROSTRUCTURES | 2012年 / 51卷 / 06期

关键词：

PbSe1-xTex; Thin films; X-ray diffraction; Electrical properties; PBSE;

D O I：

10.1016/j.spmi.2012.04.001

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Polycrystalline PbSe1-xTex ingots were prepared by solid-state microwave synthesis. Thin films of PbSe1-xTex were then deposited onto clean glass substrates using vacuum evaporation technique. Their nanostructure morphologies and stoichiometric ratio were examined using scanning electron microscopy (SEM) and energy dispersive X-ray spectra (EDX). X-ray diffraction (XRD) patterns indicated that the lattice constants of PbSe1-xTex powders and thin films increased with the increasing amount of Te. From the electrical property measurements, the thin films were characterized by n-type behavior. (c) 2012 Elsevier Ltd. All rights reserved.

引用

页码：825 / 833

页数：9

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