The "state of the art" of the diffraction analysis of crystallite size and lattice strain

This paper addresses both old, but "renovated" methods and new methods for diffraction line-profile analysis. Classical and even extremely simple single-line methods for separating "size" and "strain" broadening effects have merit for characterization of the material imperfectness, but it is generally very difficult to interpret the data obtained in terms of microstructure parameters as used in materials science. Developments of recent years, focusing on distinct anisotropic line-broadening effects, as due to the type, orientation and distribution of dislocations and minute compositional variation, will be touched upon. The most promising development may be the synthesis of line profiles on the basis of a microstructure model and application of the (kinematical) diffraction theory without any further assumption, which contrasts with the other methods. This approach can in principle be applied in single-line and multiple-line variants and also in analyses of the whole diffraction pattern. The advantage is the direct evaluation of microstructure parameters as used in materials science. The challenge is to develop microstructure models which are flexible enough to be applicable in more than one case ...