Challenges in analog and mixed-signal fault models

被引：28
|
作者：
Soma, M
机构：
[1] Department of Electrical Engineering, University of Washington, Seattle, WA
来源：
IEEE CIRCUITS AND DEVICES MAGAZINE | 1996年 / 12卷 / 01期
关键词：
D O I：
10.1109/101.481204
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：16 / 19
页数：4
相关论文
共 50 条
  • [31] Analog/mixed-signal simulator adds features
    Moretti, G
    EDN, 2002, 47 (27) : 22 - 22
  • [32] TESTING CHALLENGES FOR MIXED-SIGNAL ICS
    JACOB, G
    EE-EVALUATION ENGINEERING, 1994, 33 (05): : 154 - 155
  • [33] Expanding choices for analog/mixed-signal designers
    不详
    ELECTRONIC DESIGN, 1999, 47 (18) : 50 - +
  • [34] Analog and mixed-signal IP cores testing
    Wong, MWT
    Ko, KY
    Lee, YS
    FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS, 2002, : 3 - 7
  • [35] MULTIPLY ANALOG VOLTAGES WITH MIXED-SIGNAL DSP
    GOODENOUGH, F
    ELECTRONIC DESIGN, 1990, 38 (07) : 35 - &
  • [36] Effects of radiation on analog and mixed-signal circuits
    Lubaszewski, Marcelo
    Balen, Tiago
    Schuler, Erik
    Carro, Luigi
    Huertas, Jose Luis
    RADIATION EFFECTS ON EMBEDDED SYSTEMS, 2007, : 89 - +
  • [37] An Efficient Test Vector Generation for Checking Analog/Mixed-Signal Functional Models
    Lim, Byong Chan
    Kim, Jaeha
    Horowitz, Mark A.
    PROCEEDINGS OF THE 47TH DESIGN AUTOMATION CONFERENCE, 2010, : 767 - 772
  • [38] Analog, digital and mixed-signal design flows
    Bakeer, Hany G.
    Shaheen, Omar
    Eissal, Haitham M.
    Dessouky, Mohamed
    IDT 2007: SECOND INTERNATIONAL DESIGN AND TEST WORKSHOP, PROCEEDINGS, 2007, : 247 - 252
  • [39] Novel Metrics for Analog Mixed-Signal Coverage
    Fuertig, Andreas
    Glaeser, Georg
    Grimm, Christoph
    Hedrich, Lars
    Heinen, Stefan
    Lee, Hyun-Sek Lukas
    Nitsche, Gregor
    Olbrich, Markus
    Radojicic, Carna
    Speicher, Fabian
    2017 20TH IEEE INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUIT & SYSTEMS (DDECS), 2017, : 97 - 102
  • [40] The Art of Certifying Analog/Mixed-Signal Circuits
    Li, Peng
    IEEE DESIGN & TEST, 2015, 32 (01) : 79 - 80
12345